You can now leverage the Leica Absolute Tracker ATS800’s unique technology directly within X4.  As well as benefiting from its native acquisitions modes, such as Circle, Disc, and Patch, it’s also possible to use existing X4 acquisition strategies to acquire precisely the inspection data that you need.

This addition expands your options within X4 with another high-performance inspection device. Built on proven technology, it’s ideal for high-precision, large-scale inspection in industries like aerospace, defense, and energy.

The Pantec controller is a universal CMM solution engineered for multi-sensor systems, delivering exceptional machine throughput and accurate results. To help you maximize its capabilities, we’ve introduced two new changes designed to enhance marble stability during head movements and improve probe calibration accuracy.

These enhancements improve the precision of your measurements, giving you greater confidence in every result.

At Metrologic, we’re steadily building toward a future where inspection path creation is fully automated, no matter the machine or sensor. No more manual adjustments or chasing cycle-time reductions. Just define your features, and let Silma X4 handle the rest with it’s IPP feature. Of course, this vision isn’t realized overnight. It takes continuous innovation to navigate the complexity of your real-world use cases.

This release takes us another meaningful step forward: performance has been significantly improved for robotic line scanner scenarios, and we’ve added support for automatic CMM trajectory generation on multi-patch planes.